Combining dynamic slicing and mutation operators for ESL correction
author
Repinski, Urmas
Hantson, Hanno
Jenihhin, Maksim
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
Urmas Repinski, Hanno Hantson, Maksim Jenihhin, Jaan Raik, Raimund Ubar, ... [et al.]
source
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th-June 1st, 2012, Annecy, France
location of publication
Los Alimitos
publisher
IEEE Computer Society
year of publication
2012
pages
[6] p. : ill
conference name, date
2012 17th IEEE European Test Symposium (ETS), May 28th-June 1st, 2012
conference location
Annecy, France
url
https://ieeexplore.ieee.org/document/6233020
subject term
silumine (informaatika)
vead
parandamine
testimine
algoritmid
ISBN
978-1-4673-0697-3
notes
Bibliogr.: 28 ref
language
inglise