Parallel exact critical path tracing fault simulation with reduced memory requirements
author
Devadze, Sergei
Ubar, Raimund-Johannes
Raik, Jaan
Jutman, Artur
statement of authorship
Sergei Devadze, Raimund-Johannes Ubar, Jaan Raik, Artur Jutman
source
4th International Conference on Design and Technology of Integrated Systems in Nanoscal Era : DTIS'09 : Cairo, Egypt, April 6-9, 2009
location of publication
[S.l.]
publisher
IEEE
year of publication
2009
pages
p. 155-160 : ill
url
https://ieeexplore.ieee.org/document/4938046
subject term
elektriahelad
rikked
simulatsioon
kompuutermodelleerimine
testimine
ISBN
978-1-4244-4321-5
notes
Bibliogr.: 18 ref
language
inglise