Turning JTAG inside out for fast extended test access
author
Devadze, Sergei
Jutman, Artur
Aleksejev, Igor
Ubar, Raimund-Johannes
statement of authorship
Sergei Devadze, Artur Jutman, Igor Aleksejev, Raimund Ubar
source
10th IEEE Latin American Test Workshop : 2-5 March 2009, Brazil
location of publication
[S.l.]
publisher
IEEE
year of publication
2009
pages
[6] p. : ill
url
https://ieeexplore.ieee.org/document/4813799
subject term
tselluloosi- ja paberitööstus
riistvara
tarkvara
testimine
arvutivõrgud
võrguprotokollid
ISBN
978-1-4244-4206-5
notes
Bibliogr.: 11 ref
language
inglise