Enabling cross-layer reliability and functional safety assessment through ML-based compact models
author
Alexandrescu, Dan
Balakrishnan, Aneesh
Lange, Thomas
Glorieux, Maximilien
statement of authorship
Dan Alexandrescu, Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux
source
Proceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition
location of publication
Danvers
publisher
IEEE
year of publication
2020
pages
6 p. : ill
conference name, date
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), July 13-16, 2020
conference location
Napoli, Italy
url
https://doi.org/10.1109/IOLTS50870.2020.9159750
subject term
tehisõpe
rikked
vead
modelleerimine (teadus)
keyword
reliability
functional safety
machine learning
fault models
transient faults
soft errors
ISBN
9781728181875
notes
Bibliogr.: 9 ref
TTÜ department
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for trustworthy and efficient computing hardware (TECH)