Defect oriented fault coverage of 100stuck-at fault test sets
author
statement of authorship
M.Blyzniuk, T.Cibakova, E.Gramatova, W.Kuzmicz, M.Lobur, W.Pleskacz, J.Raik, R.Ubar
location of publication
[S. l.]
year of publication
pages
p. 511-516 : ill
ISBN
83-87202-37-1
notes
Bibliogr.: 12 ref
language
inglise
Blyzniuk, M., Cibakova, T., Gramatova, E., Kuzmicz, W., Lobur, M., Pleskacz, W., Raik, J., Ubar, R. Defect oriented fault coverage of 100stuck-at fault test sets // Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000. [S. l.], 2000. p. 511-516 : ill.