Ubar, R., Raik, J., Paomets, P., Ivask, E., Jervan, G., Markus, A.

full record print

Low-cost CAD system for teaching digital test

author

Ubar, Raimund-Johannes

Raik, Jaan

Paomets, Priidu

Ivask, Eero

Jervan, Gert

Markus, Antti

statement of authorship

R.Ubar, J.Raik, P.Paomets, E.Ivask, G.Jervan, A.Markus

source

Microelectronics education : proceedings of the European Workshop, Grenoble, France, 5-6 Feb 1996

location of publication

Singapore

publisher

World Scientific

year of publication

1996

pages

p. 185-188

ISBN

981-02-2653-5

notes

Bibl. 5 ref

Ubar, R., Raik, J., Paomets, P., Ivask, E., Jervan, G., Markus, A. Low-cost CAD system for teaching digital test // Microelectronics education : proceedings of the European Workshop, Grenoble, France, 5-6 Feb 1996. Singapore : World Scientific, 1996. p. 185-188.