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IEEE 1687 compliant ecosystem for embedded instrumentation access and in-field health monitoring

author
statement of authorship
Anton Tsertov, Artur Jutman, Konstantin Shibin, Sergei Devadze
source
location of publication
Piscataway
publisher
year of publication
pages
9 p.: ill
conference name, date
IEEE AUTOTESTCON 2018, National Harbor, September 17-20, 2018
conference location
Maryland, USA
url
ISSN
1558-4550
ISBN
978-1-5386-5223-7
notes
Bibliogr.: 13 ref
TTÜ department
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Tšertov, A., Jutman, A., Shibin, K., Devadze, S. IEEE 1687 compliant ecosystem for embedded instrumentation access and in-field health monitoring // IEEE AUTOTESTCON 2018 : National Harbor, September 17-20, 2018 : proceedings. Piscataway : IEEE, 2018. 9 p.: ill. https://doi.org/10.1109/AUTEST.2018.8532559