Investigation of charge carrier lifetime temperature-dependence in 4H-SiC diodes
author
statement of authorship
A.Udal, E.Velmre
source
Silicon carbide and related materials 2006
location of publication
[S.l.]
publisher
year of publication
pages
p. 375-378
subject term
notes
(Materials Science Forum, ISSN 0255-5476 ; 556/557)
language
inglise
Udal, A., Velmre, E. Investigation of charge carrier lifetime temperature-dependence in 4H-SiC diodes // Silicon carbide and related materials 2006. [S.l.] : Trans Tech Publications, 2007. p. 375-378.