prindi

Investigation of charge carrier lifetime temperature-dependence in 4H-SiC diodes

autor
Velmre, Enn
Udal, Andres
vastutusandmed
A.Udal, E.Velmre
allikas
Silicon carbide and related materials 2006
ilmumiskoht
[S.l.]
kirjastus/väljaandja
Trans Tech Publications
ilmumisaasta
2007
leheküljed
p. 375-378
leitav
https://www.researchgate.net/publication/250348987_Investigation_of_Charge_Carrier_Lifetime_Temperature-Dependence_in_4H-SiC_Diodes
märksõna
dioodid
ränikarbiid
temperatuur
simulatsioon
märkused
(Materials Science Forum, ISSN 0255-5476 ; 556/557)
keel
inglise
Udal, A., Velmre, E. Investigation of charge carrier lifetime temperature-dependence in 4H-SiC diodes // Silicon carbide and related materials 2006. [S.l.] : Trans Tech Publications, 2007. p. 375-378. https://www.researchgate.net/publication/250348987_Investigation_of_Charge_Carrier_Lifetime_Temperature-Dependence_in_4H-SiC_Diodes