A tool for random test generation targeting high diagnostic resolution
author
Osimiry, Emmanuel Ovie
Kostin, Sergei
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
Emmanuel Ovie Osimiry, Sergei Kostin, Jaan Raik, Raimund Ubar
source
BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia
location of publication
Tallinn
publisher
Tallinn University of Technology
year of publication
2016
pages
p. 79-82 : ill
conference name, date
2016 15th Biennial Baltic Electronics Conference, October 3-5, 2016
conference location
Tallinn, Tallinn University of Technology
url
http://www.ester.ee/record=b2150914*est
subject term
rikked
testimine
digitaaltehnika
keyword
digital circuits and systems
fault diagnosis
diagnostic resolution
ISBN
978-1-5090-1392-0
notes
Bibliogr.: 23 ref
TTÜ department
arvutitehnika instituut
language
inglise