Aleksejev, I., Jutman, A., Devadze, S. - TalTech Research Portal

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Run-time reconfigurable instruments for advanced board-level testing

author

Aleksejev, Igor

Jutman, Artur

Devadze, Sergei

statement of authorship

Igor Aleksejev, Artur Jutman, Sergei Devadze

source

IEEE instrumentation & measurement magazine

journal volume number month

vol. 20, 4

year of publication

2017

pages

p. 23-30 : ill

url

https://doi.org/10.1109/MIM.2017.8006390

ISSN

1094-6969

notes

Bibliogr.: 14 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

testimine

manussüsteemid

programmeerimine

keyword

field programmable gate arrays

test equipment

TalTechi üksused

TalTech department

arvutisüsteemide instituut

Aleksejev, I., Jutman, A., Devadze, S. Run-time reconfigurable instruments for advanced board-level testing // IEEE instrumentation & measurement magazine (2017) vol. 20, 4, p. 23-30 : ill. https://doi.org/10.1109/MIM.2017.8006390