print

Application specific true critical paths identification in sequential circuits

author
Jürimägi, Lembit
Ubar, Raimund-Johannes
Jenihhin, Maksim
Raik, Jaan
Devadze, Sergei
Oyeniran, Adeboye Stephen
statement of authorship
Lembit Jürimägi, Raimund Ubar, Maksim Jenihhin, Jaan Raik, Sergei Devadze, Adeboye Stephen Oyeniran
source
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece
location of publication
Piscataway
publisher
IEEE
year of publication
2019
pages
p. 299-304 : ill
conference name, date
25th IEEE International Symposium on On-Line Testing and Robust System Design, July 1-3, 2019
conference location
Rhodes Island, Greece
url
https://doi.org/10.1109/IOLTS.2019.8854442
subject term
integraallülitused
digitaalsignaalid
tõrked
järjendanalüüs
keyword
timing-critical path
hierarchical two-level analysis
BDDs
ISSN
1942-9401
1942-9398
ISBN
978-1-7281-2490-2
978-1-7281-2491-9
notes
Bibliogr.: 25 ref
TTÜ department
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Jürimägi, L., Ubar, R., Jenihhin, M., Raik, J., Devadze, S., Oyeniran, A. Application specific true critical paths identification in sequential circuits // 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece. Piscataway : IEEE, 2019. p. 299-304 : ill. https://doi.org/10.1109/IOLTS.2019.8854442