Comparative analysis of sequential circuit test generation approaches
author
Raik, Jaan
Krivenko, Anna
Ubar, Raimund-Johannes
statement of authorship
J.Raik, A.Krivenko, R.Ubar
source
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
location of publication
Tallinn
publisher
Tallinn University of Technology
year of publication
2004
pages
p. 225-228 : ill
subject term
generaatorid
testimine
võrdlev analüüs
ISBN
9985-59-462-2
notes
Bibliogr.: 12 ref
language
inglise