Gate-level modelling of NBTI-induced delays under process variations
author
statement of authorship
Thiago Copetti, Guilherme Medeiros, Leticia Bolzani Poehls, Fabian Vargas, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Raimund Ubar
source
location of publication
[S.l.]
publisher
year of publication
pages
p. 75-80 : ill
conference name, date
17th Latin-American Test Symposium, 6-9 April, 2016
conference location
Foz do Iguacu, Brazil
ISBN
978-1-5090-1331-9
notes
Bibliogr.: 20 ref
TTÜ department
language
inglise
subject term
keyword
Copetti, T., Medeiros, G., Bolzani Poehls, L., Vargas, F., Kostin, S., Jenihhin, M., Raik, J., Ubar, R. Gate-level modelling of NBTI-induced delays under process variations // LATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 2016. [S.l.] : IEEE, 2016. p. 75-80 : ill.