Design-for-testability for application of external test patterns in a NoC
author
Govind, Vineeth
Raik, Jaan
statement of authorship
V.Govind, J.Raik
source
2nd Workshop on Diagnostic Services in Network-on-Chips - Test, Debug, and On-Line Monitoring, in conjunction with Design Automation Conference (DAC)
location of publication
Anaheim
year of publication
2008
pages
[4] p
subject term
disain
testimine
language
inglise