Reliability evaluation of an impedance-source PV microconverter
statement of authorship
Yanfeng Shen, Elizaveta Liivik, Frede Blaabjerg, Dmitri Vinnikov, Huai Wang, Andrii Chub
location of publication
Piscataway
publisher
year of publication
pages
p. 1104–1108 : ill
conference name, date
33rd Annual IEEE Applied Power Electronics Conference and Exposition (APEC 2018), 4-8 March 2018
conference location
San Antonio, Texas, USA
ISSN
1048-2334
ISBN
978-1-5386-1181-4
notes
Bibliogr.: 23 ref
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
subject term
keyword
WOS
kvartiil
classifier
category (general)
category (sub)
Reserch Group
Shen, Y., Liivik, E., Blaabjerg, F., Vinnikov, D., Wang, H., Chub, A. Reliability evaluation of an impedance-source PV microconverter // 2018 IEEE Applied Power Electronics Conference and Exposition (APEC 2018), San Antonio, Texas, USA, 4-8 March 2018. Piscataway : IEEE, 2018. p. 1104–1108 : ill. https://doi.org/10.1109/APEC.2018.8341154