Reliability evaluation of an impedance-source PV microconverter
statement of authorship
Yanfeng Shen, Elizaveta Liivik, Frede Blaabjerg, Dmitri Vinnikov, Huai Wang, Andrii Chub
location of publication
Piscataway
publisher
year of publication
pages
p. 1104–1108 : ill
conference name, date
33rd Annual IEEE Applied Power Electronics Conference and Exposition (APEC 2018), 4-8 March 2018
conference location
San Antonio, Texas, USA
subject term
WOS
kvartiil
category (general)
category (sub)
keyword
ISSN
1048-2334
ISBN
978-1-5386-1181-4
notes
Bibliogr.: 23 ref
scientific publication
teaduspublikatsioon
classifier
TTÜ department
language
inglise
Uurimisrühm
Shen, Y., Liivik, E., Blaabjerg, F., Vinnikov, D., Wang, H., Chub, A. Reliability evaluation of an impedance-source PV microconverter // 2018 IEEE Applied Power Electronics Conference and Exposition (APEC 2018), San Antonio, Texas, USA, 4-8 March 2018. Piscataway : IEEE, 2018. p. 1104–1108 : ill.