Combinational fault simulation in sequential circuits
author
Ubar, Raimund-Johannes
Kõusaar, Jaak
Gorev, Maksim
Devadze, Sergei
statement of authorship
Raimund Ubar, Jaak Kõusaar, Maksim Gorev, Sergei Devadze
source
2015 IEEE International Symposium on Circuits and Systems : 24-27 May 2015, Lisboa, Portugal : [proceedings]
location of publication
[S.l.]
publisher
IEEE
year of publication
2015
pages
p. 2876-2879 : ill
conference name, date
2015 IEEE International Symposium on Circuits and Systems, 24-27 May, 2015
conference location
Lisboa, Portugal
subject term
elektronlülitused
rikked
diagnostika (tehnika)
kompuutersimulatsioon
algoritmid
keyword
sequential circuits
stuck-at-faults
design for testability
fault simulation with critical path tracing
ISBN
978-1-4799-8391-9
notes
Bibliogr.: 16 ref
TTÜ department
arvutitehnika instituut
language
inglise