Design error localization in digital circuits by stuck-at fault test patterns
statement of authorship
A.Jutman, R.Ubar
source
[MIEL] 2000 : 22nd International Conference on Microelectronics : Niš, Yugoslavia, 14-17 May 2000 : proceedings. Volume 2
location of publication
[S. l.]
publisher
Electron Devices Society
year of publication
pages
p. 723-726
ISBN
0-7803-5235-1
notes
Bibliogr.: 10 ref
language
inglise
Jutman, A., Ubar, R. Design error localization in digital circuits by stuck-at fault test patterns // [MIEL] 2000 : 22nd International Conference on Microelectronics : Niš, Yugoslavia, 14-17 May 2000 : proceedings. Volume 2. [S. l.] : Electron Devices Society, 2000. p. 723-726.