Metamorphic testing for verification and fault localization in industrial control systems

statement of authorship
Gaadha Sudheerbabu, Tanwir Ahmad, Dragos Truscan and Jüri Vain
location of publication
Cham
publisher
year of publication
pages
p. 127 - 159
ISBN
978-303142212-6
978-303142211-9
notes
Bibliogr.: 46 ref
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
keyword
safety and security testing
spectrum-based fault localization
Sudheerbabu, G., Ahmad, T., Truscan, D., Vain, J. Metamorphic testing for verification and fault localization in industrial control systems // CyberSecurity in a DevOps Environment: From Requirements to Monitoring. Cham : Springer Nature, 2023. p. 127 - 159. https://doi.org/10.1007/978-3-031-42212-6_5