Internet based test generation and fault simulation
author
Ivask, Eero
Ubar, Raimund-Johannes
Raik, Jaan
Schneider, Andre
statement of authorship
E.Ivask, R.Ubar, J.Raik, A.Schneider
source
IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001
location of publication
[S. l.]
year of publication
2001
pages
p. 57-60 : ill
ISBN
963 7175 16 4
notes
Bibliogr.: 7 ref