Special session: in-field ML-assisted intermittent fault localization and management in RISC-V SoCs
author
Selg, Hardi
Shibin, Konstantin
Tsertov, Anton
Jenihhin, Maksim
Ellervee, Peeter
Raik, Jaan
statement of authorship
Hardi Selg, Konstantin Shibin, Anton Tsertov, Maksim Jenihhin, Peeter Ellervee, Jaan Raik
source
2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
location of publication
Los Alamitos, California
publisher
IEEE
year of publication
2024
conference name, date
37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2024, 8-10 October 2024
conference location
Didcot
url
https://doi.org/10.1109/DFT63277.2024.10753541
subject term
tehisõpe
veaavastus
mikroprotsessorid
tehisnärvivõrgud
Scopus
https://www.scopus.com/record/display.uri?eid=2-s2.0-85212426533&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1109%2FDFT63277.2024.10753541%29&sessionSearchId=f890857a41c36254c0f644edbb3c2ac3&relpos=0
keyword
fault localization
fault management
machine learning
neural architecture search
processor architecture
ISSN
2576-1501
ISBN
979-835036688-4
notes
Bibliogr.: 13 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
arvutisüsteemide instituut
language
inglise