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A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

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Applications of modern DSP processorsKalinina, TatjanaRaadiotehnika 2001 : VIII rahvusvahelise telekommunikatsioonipäeva materjalid2001 / lk. 84-89 : ill

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journal article

Asünkroonsed protsessidToomsalu, ArvoA & A2003 / 1, lk. 7-23 : ill https://artiklid.elnet.ee/record=b1011904*est

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journal article

Automated software-based in-field self-test program synthesisJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonInternational journal of microelectronics and computer science2017 / p. 57-64 : ill

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book article

Automated software-based self-test generation for microprocessorsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonProceedings of the 24st International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2017 : Bydgoszcz, Poland, June 19-21, 20142017 / p. 453-458 : ill https://doi.org/10.23919/MIXDES.2017.8005252

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Automation of testing beyond the SoCsTšertov, Anton; Jutman, Artur; Devadze, SergeiInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis2010 / lk. 29-32 : ill

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Combined pseudo-exhaustive and deterministic testing of array multipliersOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 21st edition, 24th-26th May, Cluj-Napoca, Romania : proceedings2018 / 6 p. : ill https://doi.org/10.1109/AQTR.2018.8402708

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dissertation

Control intensive digital system synthesisTammemäe, Kalle1997 http://www.ester.ee/record=b1060033*est

dissertation

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book article

Development of a power electronics controller with RISC-V based core for security-critical applicationsSwakath, S. U.; Kshirsagar, Abhijit; Kondepu, Koteswararao; Banavath, Satish Naik; Chub, Andrii; Vinnikov, Dmitri2022 IEEE 63th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON): conference proceedings2022 / p. 1-5 https://doi.org/10.1109/RTUCON56726.2022.9978737

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A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMsCardoso Medeiros, Guilherme; Gürsoy, Cemil Cem; Fieback, Moritz; Wu, Lizhou; Jenihhin, Maksim; Taouil, Mottaqiallah; Hamdioui, Said2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings2020 / p. 792-797 https://doi.org/10.23919/DATE48585.2020.9116278

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Diagnostic modeling of microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Jenihhin, Maksim; Brik, Marina; Istenberg, Martin; Wuttke, Heinz-DietrichBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 147-150 : ill

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journal article

Dünaamiliselt rekonfigureeritava struktuuriga mikroprotsessorToomsalu, ArvoA & A2004 / 6, lk. 8-13 : ill

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journal article

Epsoni asünkroonne mikroprotsessorToomsalu, ArvoA & A2005 / 2, lk. 66-67

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book article

Experimental study of ultrasonic microprocessor - based heat metersRagauskas, A.; Pamakstis, V.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 141-145: ill

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Hardware and software of the IGBT power converterLehtla, MadisActual Problems of Electrical Drives and Industry Automation : the research symposium of young scientists : Tallinn, Estonia, May 31 - June 5, 19991999 / p. 67-70: ill

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journal article EST / journal article ENG

Hardware trojan insertion in finalized layouts : from methodology to a silicon demonstrationPerez, Tiago Diadami; Pagliarini, Samuel NascimentoIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems2023 / p. 2094-2107 https://doi.org/10.1109/TCAD.2022.3223846 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

Seotud publikatsioonid 1

Security-aware physical synthesis of integrated circuits = Integraallülituste turvateadlik füüsiline süntees

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book article

High-level combined deterministic and pseudo-exhuastive test generation for RISC processorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, Jaan2019 IEEE European Test Symposium (ETS) : proceedings2019 / 6 p. : ill https://doi.org/10.1109/ETS.2019.8791526

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book article

High-level fault diagnosis in RISC processors with Implementation-Independent Functional TestOyeniran, Adeboye Stephen; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 20222022 / p. 32-37 https://doi.org/10.1109/ISVLSI54635.2022.00019

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book article

High-level functional test generation for microprocessor modulesOyeniran, Adeboye Stephen; Ubar, Raimund-JohannesProceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 20192019 / p. 356-361 : ill https://doi.org/10.23919/MIXDES.2019.8787131

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dissertation

High-level implementation-independent software-based self-test for RISC type microprocessors = Mikroprotsessorite tarkvarapõhine implementatsioonist mittesõltuv funktsionaalne enesekontrollOyeniran, Adeboye Stephen2020 https://digikogu.taltech.ee/et/Item/08a75fbb-3f71-4fe4-b3d0-3f37a9a5f36d

dissertation

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book article

High-level modeling and testing of multiple control faults in digital systemsJasnetski, Artjom; Oyeniran, Adeboye Stephen; Tšertov, Anton; Schölzel, Mario; Ubar, Raimund-JohannesFormal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia2016 / [6] p. : ill http://dx.doi.org/10.1109/DDECS.2016.7482445

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High-level test data generation for software based self-test in microprocessorsOyeniran, Adeboye Stephen; Jasnetski, Artjom; Tšertov, Anton; Ubar, Raimund-Johannes2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 20172017 / p. 86-91 : ill https://doi.org/10.1109/MECO.2017.7977167

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book article

Implementation-independent functional test for transition delay faults in microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia2020 / p. 646-650 https://doi.org/10.1109/DSD51259.2020.00105

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book article

Implementation-independent functional test generation for RISC microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 82-87 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920323

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Importance of distributing complexity in microprocessor systemsAriste, AndriProceedings of the Symposium on microcomputer and microprocessor application, Budapest, 17-19 October, 19791979 / p. [235-244]

book article

mikroprotsessorid (subject term)

types of item

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