print

On coverage of timing related faults at board level

author

Jutman, Artur

Aleksejev, Igor

Devadze, Sergei

statement of authorship

Artur Jutman, Igor Aleksejev, Sergei Devadze

source

2016 21st IEEE European Test Symposium (ETS) : May 23rd-26th 2016, Amsterdam, The Netherlands : proceedings

location of publication

[S.l.]

publisher

IEEE

year of publication

2016

pages

[2] p. : ill

conference name, date

21st IEEE European Test Symposium, May 23-26, 2016

conference location

Amsterdam, The Netherlands

url

subject term

rikked

testimine

ISSN

1558-1780

ISBN

978-1-4673-9659-2

notes

Bibliogr.: 7 ref

TTÜ department

arvutitehnika instituut

language

inglise