Test generation with structurally synthesized BDD models
author
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
J. Raik, R. Ubar
source
Proceedings of the 5th Electronic Devices and Systems Conference, Brno, June 11-12, 1998
location of publication
Brno
publisher
Technical University, Faculty of Electrical Engineering and Computer Science
year of publication
1998
pages
p. 66-68
language
inglise