ECS an endeavor towards providing similar cache reliability behavior in different programs
author
Ahmadilivani, Mohammad Hasan
Jahromi, Mohammad Moeini
Salehi, Mostafa E.
Kargar, Mona
statement of authorship
Mohammad Hasan Ahmadilivani, Mohammad Moeini Jahromi, Mostafa E. Salehi, Mona Kargar
source
Microelectronics Reliability
publisher
Elsevier
journal volume number month
vol. 152
year of publication
2024
pages
art. 115295
url
https://doi.org/10.1016/j.microrel.2023.115295
subject term
vahemälu
protsessorid
töökindlus
arvutiprogrammid
keyword
cache vulnerability analysis
failure in time
reliability evaluation
reliability-performance trade-off
ISSN
0026-2714
notes
Bibliogr.: 25 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
https://www.scopus.com/sourceid/26717
https://www.scopus.com/record/display.uri?eid=2-s2.0-85178337397&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1016%2Fj.microrel.2023.115295%29&sessionSearchId=0b9f9fcd32592ba1f53a2482eaa5a072&relpos=0
WOS
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROELECTRON%20RELIAB&year=2023
https://www.webofscience.com/wos/woscc/full-record/WOS:001165956700001
category (general)
Engineering
Tehnika
Physics and astronomy
Füüsika ja astronoomia
Materials science
Materjaliteadus
category (sub)
Engineering. Safety, risk, reliability and quality
Tehnika. Ohutus, risk, töökindlus ja kvaliteet
Engineering. Electrical and electronic engineering
Tehnika. Elektri- ja elektroonikatehnika
Physics and astronomy. Atomic and molecular physics, and optics
Füüsika ja astronoomia. Aatomi- ja molekulaarfüüsika ning optika
Physics and astronomy. Condensed matter physics
Füüsika ja astronoomia. Kondenseeritud aine füüsika
Materials science. Surfaces, coatings and films
Materjaliteadus. Pinnad, katted ja kiled
Materials science. Electronic, optical and magnetic materials
Materjaliteadus. Elektroonilised, optilised ja magnetilised materjalid
TalTech department
arvutisüsteemide instituut
language
inglise