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Microelectronics reliability (source)
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1
journal article
Combining functional and structural approaches in test generation for digital systems
Ubar, Raimund-Johannes
Microelectronics reliability
1998
/
3, p. 317-329 : ill
journal article
2
journal article
Design error diagnosis in digital circuits with stuck-at fault model
Jutman, Artur
;
Ubar, Raimund-Johannes
Microelectronics reliability
2000
/
2, p. 307-320 : ill
journal article
3
journal article EST
/
journal article ENG
ECS an endeavor towards providing similar cache reliability behavior in different programs
Ahmadilivani, Mohammad Hasan
;
Jahromi, Mohammad Moeini
;
Salehi, Mostafa E.
;
Kargar, Mona
Microelectronics Reliability
2024
/
art. 115295
https://doi.org/10.1016/j.microrel.2023.115295
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
4
journal article EST
/
journal article ENG
Fast identification of true critical paths in sequential circuits
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
;
Jürimägi, Lembit
Microelectronics reliability
2018
/
p. 252-261 : ill
https://doi.org/10.1016/j.microrel.2017.11.027
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
5
journal article
Hierarchical test generation for combinational circuits with real defects coverage
Cibakova, Tatiana
;
Fischerova, Maria
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Microelectronics reliability
2002
/
p. 1141-1149 : ill
https://www.sciencedirect.com/science/article/pii/S002627140200080X
journal article
6
journal article
Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters
Sangwongwanich, Ariya
;
Zhou, D.
;
Liivik, Elizaveta
;
Blaabjerg, Frede
Microelectronics reliability
2018
/
p. 1003-1007
https://doi.org/10.1016/j.microrel.2018.06.094
journal article
7
journal article
Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement
Blyzniuk, M.
;
Kazymyra, I.
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Microelectronics reliability
2001
/
p. 2023-2040 : ill
https://www.sciencedirect.com/science/article/pii/S0026271401000920
journal article
8
journal article EST
/
journal article ENG
Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications
Cherezova, Natalia
;
Shibin, Konstantin
;
Jenihhin, Maksim
;
Jutman, Artur
Microelectronics reliability
2023
/
art. 115010, 10 p. : ill
https://doi.org/10.1016/j.microrel.2023.115010
Journal metrics at Scopus
Article at Scopus
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Article at WOS
journal article EST
/
journal article ENG
9
journal article EST
/
journal article ENG
Verifying cache architecture vulnerabilities using a formal security verification flow
Ghasempouri, Tara
;
Raik, Jaan
;
Paul, Kolin
;
Reinbrecht, Cezar
;
Hamdioui, Said
;
Taouil, Mottaqiallah
Microelectronics reliability
2021
/
art. 114085
https://doi.org/10.1016/j.microrel.2021.114085
Journal metrics at Scopus
Article at Scopus
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Article at WOS
journal article EST
/
journal article ENG
Number of records 9, displaying
1 - 9
keyword
26
1.
cross-layer reliability
2.
engineering reliability operational probabilities
3.
framework of reliability estimation
4.
hardware reliability
5.
high reliability
6.
high reliability leadership
7.
high reliability management
8.
high reliability organizations
9.
materials reliability
10.
Network reliability
11.
power system reliability
12.
process reliability
13.
reliability
14.
reliability analysis
15.
reliability assessment
16.
reliability assessment and enhancement
17.
Reliability engineering
18.
reliability evaluation
19.
reliability optimization
20.
reliability prediction
21.
reliability verification
22.
reliability-performance trade-off
23.
semiconductor device reliability
24.
soft-error reliability
25.
substation reliability
26.
system reliability
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