Hierarchical calculation of malicious faults for evaluating the fault-tolerance
author
statement of authorship
Raimund Ubar, Sergei Devadze, Maksim Jenihhin, Jaan Raik, Gert Jervan, Peeter Ellervee
source
Proceedings : Fourth IEEE International Symposium on Electronic Design, Test and Applications : [DELTA 2008] : 23-25 January 2008, Hong Kong, SAR, China
location of publication
Los Alamitos
publisher
year of publication
pages
p. 222-227 : ill
subject term
ISBN
978-0-7695-3110-6
notes
Bibliogr.: 14 ref
language
inglise
Ubar, R.-J., Devadze, S., Jenihhin, M., Raik, J., Jervan, G., Ellervee, P. Hierarchical calculation of malicious faults for evaluating the fault-tolerance // Proceedings : Fourth IEEE International Symposium on Electronic Design, Test and Applications : [DELTA 2008] : 23-25 January 2008, Hong Kong, SAR, China. Los Alamitos : IEEE Computer Society, 2008. p. 222-227 : ill.