JÄNES : a NAS framework for ML-based EDA applications
author
Selg, Hardi
Jenihhin, Maksim
Ellervee, Peeter
statement of authorship
Hardi Selg, Maksim Jenihhin, Peeter Ellervee
source
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
publisher
IEEE
year of publication
2021
conference name, date
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 06-08 October 2021
conference location
Athens, Greece
url
https://doi.org/10.1109/DFT52944.2021.9568321
subject term
tehisõpe
tehisnärvivõrgud
analüüs
raamprogrammid
ISSN
2765-933X
ISBN
978-1-6654-1609-2
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems