Register-transfer level deductive fault simulation using decision diagrams
author
Reinsalu, Uljana
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
Uljana Reinsalu, Jaan Raik, Raimund Ubar
source
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
location of publication
[Tallinn]
publisher
Tallinn University of Technology
year of publication
2010
pages
p. 193-196 : ill
conference name, date
12th Biennial Baltic Electronics Conference, 2010
conference location
Tallinn
subject term
rikked
simulatsioon
otsustusdiagrammid
ISSN
1736-3705
ISBN
978-1-4244-7357-1
notes
Bibliogr.: 10 ref
language
inglise