Exact static compaction of independent test sequences
author
Raik, Jaan
Jutman, Artur
Ubar, Raimund-Johannes
statement of authorship
J.Raik, A.Jutman, R.Ubar
source
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
location of publication
Tallinn
publisher
[Tallinn Technical University]
year of publication
2002
pages
p. 315-318 : ill
subject term
elektriahelad
testid
testimine
algoritmid
ISBN
9985-59-292-1
notes
Bibliogr.: 13 ref
TalTech department
arvutitehnika instituut
language
inglise