A constraint-driven gate-level test generator
author
Raik, Jaan
Ubar, Raimund-Johannes
Jervan, Gert
Krupnova, Helena
statement of authorship
Jaan Raik, Raimund Ubar, Gert Jervan, Helena Krupnova
source
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
location of publication
[Tallinn]
year of publication
1996
pages
p. 237-240: ill
subject term
generaatorid
testimine
digitaaltehnika
ISBN
9985-59-026-0
notes
Bibl. 9 ref
language
inglise