Testability analysis for efficient register-transfer level test generation [Electronic resource]
statement of authorship
T. Nõmmeots, J. Raik, R. Ubar
location of publication
[S.l.]
year of publication
pages
[4] p. [CD-ROM]
conference name, date
9th International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES 2002), June 20-22, 2002
conference location
Wroclaw, Poland
ISBN
83-89003-26-0
notes
Bibliogr.: 16 ref
language
inglise
Nõmmeots, T., Raik, J., Ubar, R.-J. Testability analysis for efficient register-transfer level test generation [Electronic resource] // 9th International Conference MIXDES 2002 : Mixed Design of Integrated Circuits and Systems, Wroclaw, Poland, 20-22 June 2002. [S.l.], 2002. [4] p. [CD-ROM].