Untestable fault identification in sequential circuits using model-checking
statement of authorship
Jaan Raik, Hideo Fujiwara, Raimund Ubar, Anna Krivenko
location of publication
Kolkata
publisher
year of publication
pages
p. 257-262 : ill
ISBN
978-93-80813-12-7
notes
Bibliogr.: 11 ref
language
inglise
Raik, J., Fujiwara, H., Ubar, R., Krivenko, A. Untestable fault identification in sequential circuits using model-checking // 2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium. Kolkata : IEEE, 2011. p. 257-262 : ill.