On NBTI-induced aging analysis in IEEE 1687 reconfigurable scan networks
author
Damljanovic, Aleksa
Squillero, Giovanni
Gürsoy, Cemil Cem
Jenihhin, Maksim
statement of authorship
Aleksa Damljanovic, Giovanni Squillero, Cemil Cem Güursoy, Maksim Jenihhin
source
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
location of publication
Piscataway
publisher
IEEE
year of publication
2019
pages
p. 335-340 : ill
conference name, date
27th IFIP/IEEE International Conference on Very Large Scale Integration, October 6-9, 2019
conference location
Cusco, Peru
url
https://doi.org/10.1109/VLSI-SoC.2019.8920313
subject term
nanoelektroonika
rikked
keyword
IJTAG
NBTI
aging
mitigation
ISSN
2324-8440
2324-8432
ISBN
978-1-7281-3915-9
978-1-7281-3916-6
notes
Bibliogr.: 22 ref
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems