Jervan, G., Markus, A., Raik, J., Ubar, R.

full record print

Assembling low-level tests to high-level symbolic test frames

author

Jervan, Gert

Markus, Antti

Raik, Jaan

Ubar, Raimund-Johannes

statement of authorship

G.Jervan, A.Markus, J.Raik, R.Ubar

source

Proceedings [of the] 15th NORCHIP Conference, Tallinn, 10-11 November 1997

location of publication

[Copenhagen]

year of publication

1997

pages

p. 275-280: ill

notes

Tiitellehel: ... 15th NORCHIP Seminar. Bibl. 6 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

testid

testimine

Jervan, G., Markus, A., Raik, J., Ubar, R. Assembling low-level tests to high-level symbolic test frames // Proceedings [of the] 15th NORCHIP Conference, Tallinn, 10-11 November 1997. [Copenhagen], 1997. p. 275-280: ill.