Defect-oriented test generation using probabilistic estimation
author
Cibakova, Tatiana
Fischerova, Maria
Gramatova, Elena
Kuzmicz, W.
Pleskacz, Witold A.
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
T.Cibakova, M.Fischerova, E.Gramatova, W.Kuzmicz, W.Pleskacz, J.Raik, R.Ubar
source
Proceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 2000
location of publication
[S. l.]
year of publication
2001
pages
p. 131-136 : ill
ISBN
83-87202-98-3
notes
Bibliogr.: 6 ref