CMOS defects analysis using DefSim measurement environment
author
statement of authorship
W.A.Pleskacz, T.Borejko, A.Walkanis, V.Stopjakova, A.Jutman, R.Ubar
source
Informal Digest of Papers : Eleventh IEEE European Test Symposium : ETS 2006 : 21-24 May 2006, Southampton, United Kingdom
location of publication
Southampton
year of publication
pages
p. 241-246 : ill
notes
Bibliogr.: 12 ref
Pleskacz, W.A., Borejko, T., Walkanis, A., Stopjakova, V., Jutman, A., Ubar, R.-J. CMOS defects analysis using DefSim measurement environment // Informal Digest of Papers : Eleventh IEEE European Test Symposium : ETS 2006 : 21-24 May 2006, Southampton, United Kingdom. Southampton, 2006. p. 241-246 : ill.