Stopjakova, Viera (author)

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  • book article
    CMOS defects analysis using DefSim measurement environmentPleskacz, Witold A.; Borejko, Tomasz; Walkanis, A.; Stopjakova, Viera; Jutman, Artur; Ubar, Raimund-JohannesInformal Digest of Papers : Eleventh IEEE European Test Symposium : ETS 2006 : 21-24 May 2006, Southampton, United Kingdom2006 / p. 241-246 : ill
    book article
  • journal article
    DefSim: a remote laboratory for studying physical defects in CMOS digital circuitsPleskacz, Witold A.; Stopjakova, Viera; Borejko, Tomasz; Jutman, Artur; Walkanis, AndrzejIEEE transactions on industrial electronics2008 / 6, p. 2405-2415 : ill
    journal article
  • book article
    DefSim: CMOS defects on chip for research and educationPleskacz, Witold A.; Borejko, Tomasz; Walkanis, A.; Stopjakova, Viera; Jutman, Artur; Ubar, Raimund-Johannes7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings2006 / p. 74-79 : ill
    book article
  • book article
    Design of an Iddq current sensor built of current devicesSpacek, Vladimir; Molnar, Jozef; Stopjakova, Viera; Weber, BedrichBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 179-182: ill
    book article
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