Towards a unified model for test and design quality
author
Aas, Einar J.
statement of authorship
Einar J. Aas
location of publication
[Tallinn]
year of publication
pages
p. 17-20: ill
ISBN
9985-59-026-0
notes
Bibl. 8 ref
Aas, E.J. Towards a unified model for test and design quality // BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings. [Tallinn], 1996. p. 17-20: ill.