On using genetic algorithm for test generation
author
Brik, Marina
Raik, Jaan
Ubar, Raimund-Johannes
Ivask, Eero
statement of authorship
M.Brik, J.Raik, R.Ubar, E.Ivask
source
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
location of publication
Tallinn
publisher
Tallinn University of Technology
year of publication
2004
pages
p. 233-236 : ill
subject term
testimine
geneetilised algoritmid
ISBN
9985-59-462-2
notes
Bibliogr.: 8 ref
language
inglise