Effect of ultrasonic treatment on the defect structure of the Si-SiO2 system
statement of authorship
D. Kropman, V. Seeman, S. Dolgov, A. Medvids
publisher
journal volume number month
vol. 13, 10-12
year of publication
pages
p. 793 - 797
subject term
ISSN
1862-6351
notes
Bibliogr.: 14 ref
scientific publication
teaduspublikatsioon
classifier
WOS
category (general)
category (sub)
quartile
TalTech department
language
inglise
Kropman, D., Seeman, V., Dolgov, S., Medvids, A. Effect of ultrasonic treatment on the defect structure of the Si-SiO2 system // Physica Status Solidi (C) Current Topics in Solid State Physics (2016) vol. 13, 10-12, p. 793 - 797.