Brygilewicz, V., Wojciechowski, J. - TalTech Research Portal

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Noise behavioral model of testing system

author

Brygilewicz, Volodymyr

Wojciechowski, Jacek

statement of authorship

Volodymyr Brygilewicz, Jacek Wojciechowski

source

BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings

location of publication

[Tallinn]

year of publication

1996

pages

p. 57-60: ill

ISBN

9985-59-026-0

notes

Bibl. 8 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

müra

testimine

mudelid

Brygilewicz, V., Wojciechowski, J. Noise behavioral model of testing system // BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings. [Tallinn], 1996. p. 57-60: ill.