Parallel fault backtracing for calculation of fault coverage
statement of authorship
Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman
source
43rd International Conference on Microelectronics, Devices and Materials and the Workshop on Electronic Testing : September 12. - September 14.2007, Bled, Slovenia : MIDEM conference 2007 proceedings
location of publication
Ljubljana
publisher
MIDEM
year of publication
pages
p. 165-170 : ill
ISBN
978-961-91023-7-4
notes
Bibliogr.: 17 ref
Ubar, R.-J., Devadze, S., Raik, J., Jutman, A. Parallel fault backtracing for calculation of fault coverage // 43rd International Conference on Microelectronics, Devices and Materials and the Workshop on Electronic Testing : September 12. - September 14.2007, Bled, Slovenia : MIDEM conference 2007 proceedings. Ljubljana : MIDEM, 2007. p. 165-170 : ill.