Combining symbolic techniques with topological approach in test generation
author
statement of authorship
R. Ubar
source
location of publication
[S.l.]
year of publication
pages
p. 377-382
language
inglise
Ubar, R. Combining symbolic techniques with topological approach in test generation // Proceedings of the 3rd Workshop on Mixed Design of Integrated Circuits and Systems, Lodz, May 1996. [S.l.], 1996. p. 377-382.