Constraint-based test pattern generation at the register-transfer level
author
Viilukas, Taavi
Raik, Jaan
Jenihhin, Maksim
Ubar, Raimund-Johannes
Krivenko, Anna
statement of authorship
Taavi Viilukas, Jaan Raik, Maksim Jenihhin, Raimund Ubar, Anna Krivenko
source
Proceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010, Vienna, Austria
location of publication
[S.l.]
publisher
IEEE
year of publication
2010
pages
p. 352-357 : ill
conference name, date
13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010
conference location
Vienna, Austria
url
http://dx.doi.org/10.1109/DDECS.2010.5491752
subject term
generaatorid
mootorid
elektriahelad
testimine
ISBN
978-1-4244-6610-8
notes
Bibliogr.: 21 ref
language
inglise