A global methodology for test program generation starting from high level specifications
author
statement of authorship
Sergei Storojev, Regis Leveugle, Gabriele Saucier
location of publication
Tallinn
year of publication
pages
p. 305-311: ill
conference name, date
BEC : Baltic Electronics Conference, October 9-14, 1994,
conference location
Tallinn (Estonia)
subject term
ISBN
9985-59-012-0
notes
Bibl. 4 ref
language
inglise
Storojev, S., Leveugle, R., Saucier, G. A global methodology for test program generation starting from high level specifications // BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1. Tallinn, 1994. p. 305-311: ill.