In-field detection of degradation on PCB assembly high-speed buses

statement of authorship
Sergei Odintsov
location of publication
Piscataway
publisher
year of publication
pages
6 p.: ill
conference name, date
IEEE AUTOTESTCON 2018, National Harbor, September 17-20, 2018
conference location
Maryland, USA
subject of form
keyword
printed circuits
ISSN
1558-4550
ISBN
978-1-5386-5223-7
notes
Bibliogr.: 11 ref
TalTech department
language
inglise