A hierarchical automatic test pattern generator based on using alternative graphs
author
Brik, Marina
Jervan, Gert
Markus, Antti
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
M. Brik, G. Jervan, A. Markus, J. Raik, R. Ubar
source
Proceedings of the 4th International Workshop Mixed Design of Integrated Circuits and Systems : MIXDES'97 : Poznan, Poland, 12-14 June 1997
location of publication
[S.l.]
year of publication
1997
pages
p. 415-420
language
inglise