print

Testing technique for embedded ADC

author
Zagursky, V.
Gertners, A.
statement of authorship
V.Zagursky, A.Gertners
source
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
location of publication
[Tallinn]
year of publication
1998
pages
p. 167-170: ill
ISBN
9985-59-081-3
notes
Bibl. 6 ref
Zagursky, V., Gertners, A. Testing technique for embedded ADC // BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings. [Tallinn], 1998. p. 167-170: ill.