Point defects interaction with extended defects in the Si-SiO2 system [Electronic resource]
author
Kropman, Daniel
Kärner, T.
Abru, Uno
Ugaste, Ülo
Mellikov, Enn
statement of authorship
D.Kropman, T.Kärner, U.Abru, Ü.Ugaste, E.Mellikov
source
Proceedings IVC-16 : Venice, 2004
year of publication
2004
pages
p. SS1-TuP394 [CD-ROM]